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1500-6000nm AR Coated Infrared Windows And Substrates Silicon
1500-6000nm ar coated infrared windows and substrates silicon is designed to maximize transmit and reduce reflectivity within 1500-6000nm. Coligh manufactures optical windows
- Broad band anti reflective coating
- Broad band high transmission range 1500-6000nm
- Silicon substrate
Infrared Window Silicon Substrate with AR Coating 1500-6000nm Description
1500-6000nm AR Coated Silicon Infrared Windows/Substrates Coligh manufactures is an infrared optical window made of high-purity single crystal silicon material through precision optical processing and anti-reflection (AR) coating technology.
- This infrared optical window has a transmittance greater than or equal to 90% in the range of 1.5-6μm. We use anti-reflection coating technology to optimize the coating for this wide band to balance the reflectivity of different wavelengths and significantly reduce the surface reflectivity.
- Single crystal silicon has a transmittance of up to 50%-60% (uncoated) in the range of 1.5-6μm, and the physical stability of high melting point and low expansion coefficient makes it an ideal infrared substrate
1500-6000nm AR Coated Infrared Windows And Substrates Silicon Datasheet
| Parameter | Specification |
| Substrate Material | Silicon |
| Wavelength Range | 1500-6000nm (SWIR-MWIR-FIR） |
| Coating Type | Anti-Reflective (AR) |
| Average Transmittance | ≥ 90%(within 1500-6000nm range) |
| Surface Quality | 60-40, 40-20 |
| Coating Method | Ion-assisted deposition / Electron-beam evaporation |
| Custom Options | Available upon request (wavelength tuning, dual-side) |
1500-6000nm AR Coated Infrared Windows And Substrates Silicon Applications
Furnace temperature field monitoring
In steel smelting arc furnaces or blast furnaces, silicon windows can be installed at the furnace wall observation port, and short-wave infrared and thermal imagers can be used to monitor the temperature distribution of molten steel, and real-time feedback is given to the control system to adjust the heating power.
Semiconductor wafer annealing process monitoring
In rapid thermal annealing equipment, silicon windows are used as process chamber windows to analyze the temperature uniformity of the wafer surface in real time through mid-infrared spectrometers to prevent lattice defects caused by thermal stress.
Chemical plant VOCs leakage monitoring
Open infrared gas sensors are deployed in chemical plant areas, and silicon windows are used as optical path protection covers to detect leakage of volatile organic compounds such as benzene and hydrogen sulfide.
Photovoltaic cell EL/PL detection
In photovoltaic cell electroluminescence or photoluminescence detection equipment, silicon windows are used as stage transmission windows to allow 1.5-1.7μm near-infrared light to penetrate and identify defects such as cell cracks and broken grids.
